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Monthly
288 pp. per issue, 6 x 9,
illustrated
Founded: 1989
ISSN 0899-7667
E-ISSN 1530-888X
2008 ISI Impact Factor: 2.378
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November 2008, Vol. 20, No. 11, Pages 2839-2861
Posted Online September 26, 2008.
(doi:10.1162/neco.2008.05-07-528)
© 2008 Massachusetts Institute of Technology
A Scalable Kernel-Based Semisupervised Metric Learning Algorithm with Out-of-Sample Generalization Ability Dit-Yan YeungDepartment of Computer Science and Engineering, Hong Kong University of Science and Technology, Clear Water Bay, Hong Kong, China. dyyeung@cse.ust.hk Hong ChangKey Lab of Intelligent Information Processing, Institute of Computing Technology, Chinese Academy of Sciences, Beijing 100190, China. changhong@ict.ac.cn Guang DaiDepartment of Computer Science and Engineering, Hong Kong University of Science and Technology, Clear Water Bay, Hong Kong, China. daiguang@cse.ust.hk
In recent years, metric learning in the semisupervised setting has aroused a lot of research interest. One type of semisupervised metric learning utilizes supervisory information in the form of pairwise similarity or dissimilarity constraints. However, most methods proposed so far are either limited to linear metric learning or unable to scale well with the data set size. In this letter, we propose a nonlinear metric learning method based on the kernel approach. By applying low-rank approximation to the kernel matrix, our method can handle significantly larger data sets. Moreover, our low-rank approximation scheme can naturally lead to out-of-sample generalization. Experiments performed on both artificial and real-world data show very promising results.
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